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Jeol JSM 5600 SEM
 
Jeol JSM 5600 SEM

The SEM uses a tungsten filament as the electron source. There is a camera for taking digital micrographs of the specimen which can be stored on the computer. Analytical elemental analysis can be carried out on the specimen using the EDX system attached. Three modes can be used; Spectral analysis, Point analysis and Elemental mapping.

Technical information
Resolution: 3.5nm.
Probe current: 10-12 to 10-6 A.
Accelerating Voltage:0.5 to 30 kV (53 steps)
Magnification: up to 300,000x.
Specimen area: up to 125 mm in diameter.
Image mode: SEI.
 
Ross Blackley on 2011
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