Electron Microscopy Facility

News

21/7/15 Installation of Scios Dualbeam

News 1A new FEI Scios Dualbeam funded through the EPSRC's Capital for great technologies has been installed and commissioned at the School of Chemistry's electron microscopy facility.
This new instrument combines a high resolution scanning electron microscope and gallium ion beam for selective milling of the sample. This enables a wide range of imaging options as well as the ability to cross-section and image a sample in-situ and prepare samples for transmission electron microscopy.
For more information please contact David Miller.